VME-3113B

Scanning 12-bit Analog-to-Digital Converter with Built-in-Test
VME-3113B

This product entered a Restricted Production Phase (RPP) on March 22, 2023

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Overview

VME-3113B, Scanning 12-bit Analog-to-Digital Converter with Built-in-Test

  • Powers up in autoscanning mode-no software initialization required
  • Continually digitizes all input channels and stores the results in dedicated channel dual-port registers (autoscanning mode)
  • 64 differential or single-ended inputs
  • Supports real-time and off-line Built-in-Test

Specifications

Channel Voltage Ranges
0-10V, ±5V, ±10V
Channels
64
Form Factor
VME
Function
12-bit ADC
Throughput
33 kHz

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VME-3113B

Scanning 12-bit Analog-to-Digital Converter with Built-in-Test
VME-3113B
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